Bruker (NASDAQ: BRKR) today announced the release of Inspire™,
the first integrated scanning probe microscopy (SPM) infrared system for
10-nanometer spatial resolution in chemical and materials property
mapping. The new and unique Inspire system incorporates
Bruker’s proprietary PeakForce IR™ mode to enable nanoscale
infrared reflection and absorption mapping for a wide range of
applications, including the characterization of microphases and their
interfaces in polymer blends, plasmons in the two-dimensional electron
gas of graphene, and chemical heterogeneity in complex materials and
thin films.
Bruker's new integrated scanning probe microscopy (SPM) infrared system - Inspire (Photo: Business Wire)
The Inspire system features sensitivity down to molecular
monolayers, even on samples not amenable to standard atomic force
microscopy techniques. Inspire utilizes fully integrated
infrared scattering, scanning near-field optical microscope (SNOM)
optics, point-and-click alignment, and the full suite of exclusive PeakForce
Tapping® technologies found on Bruker’s performance-leading
AFMs, from ScanAsyst®
self-optimization to quantitative PeakForce
QNM® nanomechanics and PeakForce
KPFM™ work function measurements. The resulting Inspire solution
now provides instant access to the highest resolution chemical,
plasmonics, nanomechanical, and electrical characterization for new
scientific research and nano-analytical frontiers.
“The infrared scattering SNOM technique has great potential for new
scientific discoveries through highest resolution spatio-spectral
imaging,” explained Professor Markus B. Raschke, Departments of Physics
and Chemistry, and JILA, at the University of Colorado, Boulder. “Its
wide, productive application has been held back by the lack of an
integrated solution.”
“With Inspire, we now have provided this integrated
solution, which is a major milestone on our path to enable even more
widespread AFM adoption by providing new, nanoscale chemical information
to researchers,” added David V. Rossi, Executive Vice President and
General Manager of Bruker's AFM Business. “Inspire builds
upon our exclusive PeakForce Tapping technology to provide a
complete set of the highest resolution nanochemical and nanomechanical
property maps together with topography in a single SPM measurement.”
About Inspire
Inspire is a scanning probe based nanoscale
characterization system that extends atomic force microscopy into the
chemical regime by providing infrared absorption and reflection imaging
down to a spatial resolution of 10 nanometers utilizing scattering
scanning near-field optical microscopy (SNOM). Inspire
includes all optics, detectors and configurable sources, as well as all
AFM hardware and software for atomic resolution imaging in a compact and
robust integrated package. Inspire also comes with
Bruker’s new PeakForce IR mode, which builds on Bruker’s
exclusive PeakForce Tapping direct force control technology. PeakForce
IR overcomes the limitations of contact and of TappingMode™,
and thus of traditional near-field optical and photothermal approaches
to nanoscale infrared imaging. It also avoids sample damage from lateral
forces, retaining highest resolution on soft polymers, and enables
high-resolution imaging of polymer brushes and even powders. PeakForce
IR includes ScanAsyst self-optimization and PeakForce QNM
for instantly correlated nanomechanical data. The comprehensive set of
optional modes includes PeakForce TUNA™, which enables
conductivity mapping on samples not amenable to contact mode AFM, and PeakForce
KPFM, which employs FM detection for the highest spatial resolution
work function mapping while avoiding the mechanical cross-talk affecting
single-pass FM-KPFM.
About Bruker Corporation
Bruker Corporation is a leading provider of high-performance scientific
instruments and solutions for molecular, cellular and materials
research, as well as for industrial, diagnostics, clinical research and
applied analysis. For more information about Bruker Corporation, please
visit www.bruker.com.

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