My afternoon random walk.
As I was researching a new stock also related to in-line measurement and control, I ended up strolling into some inline metrology papers in the semmi-con space. Reflecting back to the recent Jjune 2018 presentation slide of the current steps in the fab process that PHO was involved in matched to this gives me a greater appreciation for some of the immense challenges in process measurement and control that are present. Take the following link as an example, while not explicitly germaine to PHO, I think gives a flavour of opportunities (and perhaps some future random walks)
https://semiengineering.com/optical-metrology-solutions-for-10nm-films-process-control-challenges/
Cheers!
Gro